Application of spectral reflectance to the monitoring of ZnO nanorod growth
SCIE
SCOPUS
- Title
- Application of spectral reflectance to the monitoring of ZnO nanorod growth
- Authors
- Ghong, TH; Kim, YD; Ahn, E; Yoon, E; An, SJ; Yi, GC
- Date Issued
- 2008-11-30
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- By using spectral reflectance (SR), we report on the in situ monitoring of ZnO nanorod growth on Si and sapphire substrates by catalyst-free, low pressure metalorganic chemical vapor deposition. Initially, the SR signals showed the same behavior at various wavelengths but at some point they began to strongly interfere and oscillate. This is interpreted as the starting point of the growth of nanorods. Simulation results using a multilayer model confimed our analysis. (c) 2008 Elsevier B.V. All rights reserved.
- Keywords
- ZnO nanorod; Silicon; Spectral reflectance; In situ monitoring; OPTICAL-PROPERTIES
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/22401
- DOI
- 10.1016/j.apsusc.2008.07.048
- ISSN
- 0169-4332
- Article Type
- Article
- Citation
- APPLIED SURFACE SCIENCE, vol. 255, no. 3, page. 746 - 748, 2008-11-30
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