EVIDENCE OF SUBSTRATE METALLIZATION BY LI ADSORPTION ON THE SI(001) SURFACE
SCIE
SCOPUS
- Title
- EVIDENCE OF SUBSTRATE METALLIZATION BY LI ADSORPTION ON THE SI(001) SURFACE
- Authors
- Lee, KD; Kim, CY; Chung, JW
- Date Issued
- 1996-10-20
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- We report an evidence of substrate metallization induced by Li adsorption on the Si(001) surface, based on the combined results of electron energy-loss (EEL) and angle-resolved photoemission (ARP) measurements. The metallic surface at a low dose of Li manifests itself as a loss peak due to an intraband surface plasmon in EEL spectra and a metallic peak in ARP spectra. These peaks are coherently understood in terms of substrate metallization, where electrons from Li adatoms partially occupy the empty substrate surface bands. Furthermore, the unique negative dispersion of the plasmon reveals that local field effects may cause such an anomalous dispersion.
- Keywords
- alkali metals; angle resolved photoemission; electron energy loss spectroscopy; metal-semiconductor interfaces; silicon; surface electronic phenomena; ALKALI-METAL ADSORPTION; PHOTOELECTRON-SPECTROSCOPY; PLASMON DISPERSION; SI(100) SURFACE; EXCITATIONS; STATES
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/21471
- DOI
- 10.1016/0039-6028(96)00934-X
- ISSN
- 0039-6028
- Article Type
- Article
- Citation
- SURFACE SCIENCE, vol. 366, no. 2, page. L709 - L714, 1996-10-20
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