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Voltage distribution of the narrow disordered NIS interface SCIE SCOPUS

Title
Voltage distribution of the narrow disordered NIS interface
Authors
Lee, SWGalaktionov, AVRyu, CM
Date Issued
1999-05
Publisher
KOREAN PHYSICAL SOC
Abstract
We present a self-consistent procedure of calculating a voltage distribution near normal metal-insulator-superconductor (NIS) interface in a dirty metal with magnetic impurities. The transversal dimensions of the interface are assumed to be smaller than the London penetration depth. The system of nonequilibrium quasiclassical equation for this realization is linearized in the limit of small current and is solved numerically for different barrier strengths. The differential conductance of the interface is shown to be in the order of the normal state conductance.
Keywords
PHASE
URI
https://oasis.postech.ac.kr/handle/2014.oak/20396
ISSN
0374-4884
Article Type
Article
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 34, no. SUP.2, page. S193 - S198, 1999-05
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