Tunneling properties of in-situ-fabricated intrinsic Josephson junctions in Bi2Sr2CaCu2O8+x single crystals
SCIE
SCOPUS
- Title
- Tunneling properties of in-situ-fabricated intrinsic Josephson junctions in Bi2Sr2CaCu2O8+x single crystals
- Authors
- Doh, YJ; Lee, HJ
- Date Issued
- 2000-07
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Slacks of intrinsic Josephson junctions were fabricated on the surface of Bi2Sr2CaCu2O8+x single crystals, using photolithography and Ar-ion etching. The number of junctions in a stack was controlled by the etching time, while the c-axis I-V and R versus T curves were measured in-situ in a vacuum chamber for T down to similar to 13 K. The tunneling resistance and the I-V curves are scaled by the surface junction resistance. The superconductivity of the surface conducting plane in contact with a Au electrode is weakened by the proximity to the normal metal. In a low-bias region, main tunneling properties of a junction are not affected by the presence of other junctions in a stack. (C) 2000 Elsevier Science B.V. All rights reserved.
- Keywords
- in-situ fabrication; intrinsic Josephson effects; Bi-2212; surface junction
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/19994
- DOI
- 10.1016/S0921-4526(99)02233-4
- ISSN
- 0921-4526
- Article Type
- Article
- Citation
- PHYSICA B, vol. 284, page. 606 - 607, 2000-07
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- There are no files associated with this item.
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