Reentrance of conductance in mesoscopic normal-metal/superconductor junctions
SCIE
SCOPUS
- Title
- Reentrance of conductance in mesoscopic normal-metal/superconductor junctions
- Authors
- Kim, N; Lee, H; Chang, HS; Kim, JJ; Lee, JO; Park, JW; Yoo, KH
- Date Issued
- 2000-07
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- Two different kinds of mesoscopic N-S-N junctions were fabricated by sandwiching Al or Pb film between two closely separated Au wires. dV/dI versus V curves for an Au-Pb-Au junction show a sharp zero-bias dip, while those for an Au-Al-Au show a reentrant zero-bias maximum. Interference between conjugate electrons and holes at an interface with different degree of transparency is responsible for the contrasting behavior. (C) 2000 Elsevier Science B.V. All rights reserved.
- Keywords
- Andreev reflection; proximity effect; reentrance of conductance; SUPERCONDUCTOR
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/19988
- DOI
- 10.1016/S0921-4526(99)02900-2
- ISSN
- 0921-4526
- Article Type
- Article
- Citation
- PHYSICA B, vol. 284, page. 1866 - 1867, 2000-07
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- There are no files associated with this item.
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