Measurement of two-tone transfer characteristics of high-power amplifiers
SCIE
SCOPUS
- Title
- Measurement of two-tone transfer characteristics of high-power amplifiers
- Authors
- Yang, Y; Yi, J; Nam, J; Kim, B; Park, M
- Date Issued
- 2001-03
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGI
- Abstract
- In this paper, we present an accurate measurement method for acquiring the two-tone transfer characteristics of high-power amplifiers. The measurement setup and sequence are described. The measured amplitude and phase data of the two-tone fundamental, third-order intermodulation, and fifth-order intermodulation components versus input power level are also presented. The measured two-tone transfer characteristics are very useful for the design of a predistortion linearizer or for nonlinear model extraction for high-power amplifiers.
- Keywords
- AM-AM; AM-PM; high-power amplifier; memory effect; two-tone transfer characteristics; SPECTRAL REGROWTH
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/19634
- DOI
- 10.1109/22.910567
- ISSN
- 0018-9480
- Article Type
- Article
- Citation
- IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. 49, no. 3, page. 568 - 571, 2001-03
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.