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Ferroelectric thin film microwave examination SCIE SCOPUS
- Title
- Ferroelectric thin film microwave examination
- Authors
- Kazmirenko, V; Poplavko, Y; Pereverzeva, L; Prokopenko, Y; Kim, B; Jeong, M; Baik, S
- Date Issued
- 2003-01
- Publisher
- TAYLOR & FRANCIS LTD
- Abstract
- A method for measuring of microwave properties at ferroelectric thin films has been developed, Studied films are deposited onto dielectric substrates, and film-on-substrate "sandwich" is arranged along waveguide. S-11(f) or S-21(f) dependences are studied depending on sensitivity. Redundant measured data processed with specially developed software.
- Keywords
- ferroelectric; thin film; permittivity; loss tangent; rectangular waveguide
- ISSN
- 0015-0193
- Article Type
- Article
- Citation
- FERROELECTRICS, vol. 286, page. 1075 - 1078, 2003-01
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