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0.3-nm SASE-FEL at PAL
- Title
- 0.3-nm SASE-FEL at PAL
- Authors
- Oh, JS; Kim, DE; Kim, ES; Park, SJ; Kang, HS; Lee, TY; Koo, TY; Chang, SS; Chung, CW; Nam, SH; Namkung, W
- Date Issued
- Jan-2004
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- PAL; X-ray SASE; in-vacuum undulator; 0.3 nm; third-harmonic enhancement
- ISSN
- 0168-9002
- Article Type
- Article
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 528, no. 1-2, page. 582 - 585, 2004-01
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