Radiography simulation on single-shot dual-spectrum X-ray for cargo inspection system
SCIE
SCOPUS
- Title
- Radiography simulation on single-shot dual-spectrum X-ray for cargo inspection system
- Authors
- Gil, Y; Oh, Y; Cho, M; Namkung, W
- Date Issued
- 2011-02
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Abstract
- We propose a method to identify materials in the dual energy X-ray (DeX) inspection system. This method identifies materials by combining information on the relative proportions T of high-energy and low-energy X-rays transmitted through the material, and the ratio R of the attenuation coefficient of the material when high-energy are used to that when low energy X-rays are used. In Monte Carlo N-Particle Transport Code (MCNPX) simulations using the same geometry as that of the real container inspection system, this T vs. R method successfully identified tissue-equivalent plastic and several metals. In further simulations, the single-shot mode of operating the accelerator led to better distinguishing of materials than the dual-shot system. (C) 2010 Elsevier Ltd. All rights reserved.
- Keywords
- Dual energy X-ray; Radiography; MCNP; Material identification; Cargo inspection; SCINTILLATOR; PHOTODIODE; NEUTRON; SCANNER; BEAM
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/17601
- DOI
- 10.1016/J.APRADISO.2010.11.011
- ISSN
- 0969-8043
- Article Type
- Article
- Citation
- APPLIED RADIATION AND ISOTOPES, vol. 69, no. 2, page. 389 - 393, 2011-02
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