Quantitative analysis and measurements of near-field interactions in terahertz microscopes
SCIE
SCOPUS
- Title
- Quantitative analysis and measurements of near-field interactions in terahertz microscopes
- Authors
- Moon, K; Jung, E; Lim, M; Do, Y; Han, H
- Date Issued
- 2011-06-06
- Publisher
- OPTICAL SOC AMER
- Abstract
- We demonstrated quantitative analysis and measurements of near-fields interactions in a terahertz pulse near-field microscope. We developed a self-consistent line dipole image method for the quantitative analysis of the near-field interaction in THz scattering-type scanning optical microscopes. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations. (C) 2011 Optical Society of America
- Keywords
- OPTICAL MICROSCOPY; NANOMETER RESOLUTION; SPECTROSCOPY; SPHERE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/17185
- DOI
- 10.1364/OE.19.011539
- ISSN
- 1094-4087
- Article Type
- Article
- Citation
- OPTICS EXPRESS, vol. 19, no. 12, page. 11539 - 11544, 2011-06-06
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- There are no files associated with this item.
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