In-situ Determination of Interface Dipole Energy between Tris(8-hydroxyquinoline) Aluminum and MgO Coated Al in Inverted Top-Emitting Organic Light-Emitting Diodes
SCIE
SCOPUS
- Title
- In-situ Determination of Interface Dipole Energy between Tris(8-hydroxyquinoline) Aluminum and MgO Coated Al in Inverted Top-Emitting Organic Light-Emitting Diodes
- Authors
- Kim, SY; Hong, K; Lee, JL
- Date Issued
- 2011-10
- Publisher
- JAPAN SOCIETY OF APPLIED PHYSICS
- Abstract
- The interface dipole energies between tris(8-hydroxyquinoline) aluminum (Alq(3)) and Al/MgO (or bare Al) were in-situ measured using synchrotron radiation photoemission spectroscopy. The work function of Al/MgO is higher by 0.6 eV than that of Al. The interface dipole energies were determined to be -0.3 and 0.2 eV for Al/MgO and bare Al, respectively. Therefore, the barrier height of Al/MgO is higher by 0.3 eV than that of Al. The operating voltage at a current density of 50 mA/cm(2) of inverted top-emitting organic light-emitting diode (ITOLED) using Al/MgO cathode decreased from 14.3 to 11.7 V, and the luminance value at the current density of 222 mA/cm(2) of ITOLED increased from 1830 to 1950 cd/m(2). Therefore, it is considered that MgO interfacial layer played a role in reducing the effective barrier height of electron injection by tunneling mechanism, leading to a reduction in turn-on voltage and luminance enhancement. (C) 2011 The Japan Society of Applied Physics
- Keywords
- ELECTRON INJECTION LAYER; LEVEL ALIGNMENT; ELECTRONEGATIVITY; EFFICIENCY; OXIDE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/16999
- DOI
- 10.1143/JJAP.50.101602
- ISSN
- 0021-4922
- Article Type
- Article
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 50, no. 10, page. 101602, 2011-10
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