Colloidal wettability probed with X-ray microscopy
SCIE
SCOPUS
- Title
- Colloidal wettability probed with X-ray microscopy
- Authors
- Byung Mook Weon; Lee, JS; Kim, JT; Pyo, J; Je, JH
- Date Issued
- 2012-12
- Publisher
- ELSEVIER
- Abstract
- Colloids (colloidal particles or nanoparticles) and their in-situ characterizations are important topics in colloid and interface science. In-situ visualization of colloids with X-ray microscopy is a growing frontier. Here, after a brief introduction on the method, we focus on its application for identifying nanoscale wettability of colloidal particles at fluid interfaces, which is a critical factor in colloidal self-assembly. We discuss a quantitative study on colloidal wettability with two microscopic methods: (i) X-ray microscopy by visualizing natural oil-water interfaces and (ii) confocal microscopy by visualizing fluorescently-labeled interfaces. Both methods show consistent estimation results in colloid-fluid interfacial tensions. This comparison strongly suggests a feasibility of X-ray microscopy as a promising in-situ protocol in colloid research, without fluorescent staining. Finally, we address a prospect of X-ray imaging for colloid and interface science. (C) 2012 Elsevier Ltd. All rights reserved.
- Keywords
- Colloids; X-ray microscopy; Confocal microscopy; In-situ visualization; Colloidal wettability; Interfacial tension; ATOMIC-FORCE MICROSCOPY; VIDEO MICROSCOPY; INTERFACIAL TENSIONS; COMPUTED-TOMOGRAPHY; DISPERSION FORCES; CONTRAST; PARTICLES; CRYSTALS; RESOLUTION; LIQUID
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/16294
- DOI
- 10.1016/J.COCIS.2012.08.002
- ISSN
- 1359-0294
- Article Type
- Article
- Citation
- CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, vol. 17, no. 6, page. 388 - 395, 2012-12
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