Following the DNA Ligation of a Single Duplex Using Atomic Force Microscopy
SCIE
SCOPUS
- Title
- Following the DNA Ligation of a Single Duplex Using Atomic Force Microscopy
- Authors
- Kim, EungSam; Kim, JungSook; Lee, Yoonhee; Choi, KY; Park, JW
- Date Issued
- 2012-07
- Publisher
- American Chemical Society
- Abstract
- Nick-sealing of a single DNA duplex was studied with the use of atomic force microscopy (AFM). To form a nick between a 47mer DNA and a 24mer DNA, the complementary 71mer template DNA immobilized on an AFM tip was hybridized with the 47mer DNA and brought into contact with the 24mer DNA on a substrate surface. The AFM tip and substrate surface were modified with dendron molecules to ensure the formation of a single DNA duplex. When a single nick in the DNA duplex was sealed by DNA ligase during a pause, an increase in the unbinding force was observed after the pause. The change from 24.0 +/- 4.4 piconewtons (pN) to 62.8 +/- 14.6 pN matched well with the resulting DNA length (71 bp). Additionally, a 30 s pause showed a 3-fold higher nick-sealing probability (60%) than a 10 s pause, while the probability did not increase with a 120 s pause. In the presence of free 47mer DNAs in solution, the single nick-sealing event could be repeated at other positions.
- Keywords
- DNA ligation; single-molecule manipulation; atomic force microscopy; unbinding force measurement; dendron-modified surface; DIP-PEN NANOLITHOGRAPHY; ENZYMATIC NANOLITHOGRAPHY; PROTEIN; MOLECULES; LIGASE; SPECTROSCOPY; GOLD
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/15762
- DOI
- 10.1021/NN301200K
- ISSN
- 1936-0851
- Article Type
- Article
- Citation
- ACS Nano, vol. 6, no. 7, page. 6108 - 6114, 2012-07
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- There are no files associated with this item.
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