An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
SCIE
SCOPUS
- Title
- An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
- Authors
- Lee, E; Kim, M; Seong, J; Shin, H; Lim, G
- Date Issued
- 2013-06
- Publisher
- WILEY-V C H VERLAG GMBH
- Abstract
- We present an L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) capable of imaging the surface topography and the electrochemical activity of nanostructures of interest. Owing to the geometry of the protrusive peak in the L-shaped probe, the distance between the probe electrode and the substrate is maintained precisely at approximate to 100 nm during surface scanning. The reduction in electrode-to-substrate distance significantly improves the positive feedback current on top of the electrochemically active nanomaterials. The L-shaped nanoprobe successfully acquired simultaneous a topographical image and an electrochemical current image of individual carbon nanotubes (CNTs) in a two-dimensional (2D) CNT network. Schematic diagram of an L-shaped nanoprobe for SECM-AFM: the nanoprobe has a triangular frame nanoelectrode and a protrusive insulating peak at the end of the AFM tip. ((c) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
- Keywords
- scanning electrochemical microscopy; SECM; AFM; nanoprobes; carbon nanotubes; HETEROGENEOUS ELECTRON-TRANSFER; FABRICATION; PROBES; SECM; CANTILEVER; SURFACES
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/15319
- DOI
- 10.1002/PSSR.201307120
- ISSN
- 1862-6254
- Article Type
- Article
- Citation
- PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, vol. 7, no. 6, page. 406 - 409, 2013-06
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