Ferroelectric and piezoelectric behavior of (111)-oriented Pb(ZrxTi1-x)O-3 thin films on cobalt ferrite nano-seed layered Pt(111)/Si substrate
SCIE
SCOPUS
- Title
- Ferroelectric and piezoelectric behavior of (111)-oriented Pb(ZrxTi1-x)O-3 thin films on cobalt ferrite nano-seed layered Pt(111)/Si substrate
- Authors
- Khodaei, M; Seol, D; Ebrahimi, SAS; Park, YJ; Seo, H; Kim, Y; Baik, S
- Date Issued
- 2014-04
- Publisher
- SPRINGER
- Abstract
- Perfect (111)-oriented Pb(ZrxTi1-x)O-3 (PZT) thin films were grown on cobalt ferrite buffered Pt(111)/Ti/SiO2/Si substrate by pulsed laser deposition method using various targets with different Zr/Ti ratios ranging from 30/70 to 70/30. The results of X-ray diffraction analyses indicated that the composition of morphotropic phase boundary in the present PZT films is same as the bulk PZT (Zr/Ti = 52/48). The effect of Zr/Ti ratio of the PZT films was investigated by the ferroelectric domain structure and the piezoelectric characteristics of the films by piezoresponse force microscopy, as well as polarization measurement. The results revealed that the present tetragonal PZT film has a higher ferroelectric domain switching than rhombohedral one and the film with composition of Zr/Ti = 52/48 showed relatively high value of squareness of P-E loop and E-c as well as high piezoresponse.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/14161
- DOI
- 10.1007/S10854-014-1785-6
- ISSN
- 0957-4522
- Article Type
- Article
- Citation
- JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, vol. 25, no. 4, page. 1696 - 1702, 2014-04
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.