Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles
SCIE
SCOPUS
- Title
- Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles
- Authors
- Kling, NG; Paul, D; Gura, A; Laurent, G; De, S; Li, H; Wang, Z; Ahn, B; Kim, CH; Kim, TK; Litvinyuk, IV; Cocke, CL; Ben-Itzhak, I; Kim, D; Kling, MF
- Date Issued
- 2014-05
- Publisher
- IOP PUBLISHING LTD
- Abstract
- A novel design for a velocity-map imaging (VMI) spectrometer with high resolution over a wide energy range surpassing a standard VMI design is reported. The main difference to a standard three-electrode VMI is the spatial extension of the applied field using 11 electrodes forming a thick-lens. This permits measurements of charged particles with higher energies while achieving excellent resolving power over a wide range of energies. Using SIMION simulations, the thick-lens VMI is compared to a standard design for up to 360 eV electrons. The simulations also show that the new spectrometer design is suited for charged-particle detection with up to 1 keV using a repeller-electrode voltage of -30 kV. The experimental performance is tested by laser-induced ionization of rare gases producing electrons up to about 70 eV. The thick-lens VMI is useful for a wide variety of studies on atoms, molecules and nanoparticles in intense laser fields and high-photon-energy fields from high-harmonic-generation or free-electron lasers.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/13549
- DOI
- 10.1088/1748-0221/9/05/P05005
- ISSN
- 1748-0221
- Article Type
- Article
- Citation
- JOURNAL OF INSTRUMENTATION, vol. 9, 2014-05
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- There are no files associated with this item.
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