Multiple-retrapping processes in the phase-diffusion regime of high-T-c intrinsic Josephson junctions
SCIE
SCOPUS
- Title
- Multiple-retrapping processes in the phase-diffusion regime of high-T-c intrinsic Josephson junctions
- Authors
- Bae, MH; Sahu, M; Lee, HJ; Bezryadin, A
- Date Issued
- 2009-03
- Publisher
- AMER PHYSICAL SOC
- Abstract
- We report measurements of switching current distribution (SWCD) from a phase-diffusion branch (PDB) to a quasiparticle-tunneling branch (QTB) as a function of temperature in a cuprate-based intrinsic Josephson junction. Contrary to the thermal-activation model, the width of the SWCD increases and the corresponding switching rate shows a nonlinear behavior with a negative curvature in a semilogarithmic scale with decreasing temperature down to 1.5 K. Based on the multiple-retrapping model, we quantitatively demonstrate that the frequency-dependent junction quality factor, representing the energy dissipation in a phase-diffusion regime, determines the observed temperature dependence of the SWCD and the switching rate. We also show that a retrapping process from the QTB to the PDB is related to the low-frequency limit damping.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/12216
- DOI
- 10.1103/PhysRevB.79.104509
- ISSN
- 1098-0121
- Article Type
- Article
- Citation
- PHYSICAL REVIEW B, vol. 79, no. 10, page. 1045091 - 1045095, 2009-03
- Files in This Item:
-
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.