Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device
- Title
- Experimental Demonstration of Probabilistic-Bit (p-bit) Utilizing Stochastic Oscillation of Threshold Switch Device
- Authors
- SEONGJAE, HEO; KIM, DONGMIN; CHOIWOOSEOK; SANGHYUN, BAN; KWON, OHYEOG; Hwang, Hyunsang
- Date Issued
- 2023-06-13
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Abstract
- To realize p-bits that fluctuate between 0 and 1 with precisely controlled probabilities, stochastic oscillation behavior of threshold switch (TS) device was induced by applying supply voltage (VDD) near-threshold voltage (VTH). Insulator-metal transition (IMT) device and ovonic threshold switch (OTS) device were investigated as a source of p-bit generation. It was confirmed that a small voltage change of mV-scale in the near-threshold region can give a high degree of stochasticity to the oscillation frequency. Also, the probability was controlled by a comparator and shift of a compare-voltage (Vcomp) with excellent controllability. Finally, a simple probabilistic Boolean logic operation was tested by 100 p-bits generated from IMT devices.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/121033
- Article Type
- Conference
- Citation
- 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023, 2023-06-13
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