Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers
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- Title
- Diffuse x-ray scattering study of interfacial structure of self-assembled conjugated polymers
- Authors
- Wang, J; Park, YJ; Lee, KB; Hong, H; Davidov, D
- Date Issued
- 2002-10-15
- Publisher
- AMERICAN PHYSICAL SOC
- Abstract
- The interfacial structures of self-assembled heterostructures through alternate deposition of conjugated and nonconjugated polymers were studied by x-ray reflectivity and nonspecular scattering. We found that the interfacial width including the effects of both interdiffusion and interfacial roughness (correlated) was mainly contributed by the latter one. The self-assembled deposition induced very small interdiffusion between layers. The lateral correlation length xi(parallel to) grew as a function of deposition time (or film thickness) described by a power law xi(parallel to)proportional tot(beta/H) and was also observed from the off-specular scattering.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/12084
- DOI
- 10.1103/PhysRevB.66.161201
- ISSN
- 1098-0121
- Article Type
- Article
- Citation
- PHYSICAL REVIEW B, vol. 66, no. 16, 2002-10-15
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