Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers: An extended x-ray absorption fine structure study
SCIE
SCOPUS
- Title
- Clear evidence for strain changes according to Co layer thickness in metastable Co/Pd(111) multilayers: An extended x-ray absorption fine structure study
- Authors
- Kim, SK; Koo, YM; Chernov, VA; Padmore, H
- Date Issued
- 1996-04-15
- Publisher
- AMERICAN PHYSICAL SOC
- Abstract
- We have measured fluorescence-yield extended x-ray absorption fine structure (EXAFS) on a series of (Co x Angstrom+Pd 11 Angstrom)(13) metallic multilayers. To examine the local atomic structure around Co and its anisotropy, Co K-edge EXAFS measurements were performed at near-grazing incidence of synchrotron radiation incorporating linear polarization dependence. We generally observed, with decreasing Co layer thickness, increasing, in-plane interatomic distance and decreasing, out-of-plane interatomic distance in Co atoms. For a (Co 10 Angstrom +Pd 11 Angstrom)(13) multilayer, strain values of in-plane and out-of-plane Co atoms are estimated to be 3.6+/-0.5% in tensile and 3.0+/-0.4% in compressive strain.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/12001
- DOI
- 10.1103/PhysRevB.53.11114
- ISSN
- 0163-1829
- Article Type
- Article
- Citation
- PHYSICAL REVIEW B, vol. 53, no. 16, page. 11114 - 11119, 1996-04-15
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