Study on the VDD scalability of complementary ternary logic circuit using stack channel ternary thin film transistor
- Title
- Study on the VDD scalability of complementary ternary logic circuit using stack channel ternary thin film transistor
- Authors
- LEE, BYOUNG HUN
- Date Issued
- 2022-07-07
- Publisher
- 나노기술연구협의회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/116468
- Article Type
- Conference
- Citation
- THE 20TH NANO KOREA 2022, 2022-07-07
- Files in This Item:
- There are no files associated with this item.
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