Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
반도체 제조 공정의 군집성 불량 패턴의 원인 설비 탐색 체계
- Title
- 반도체 제조 공정의 군집성 불량 패턴의 원인 설비 탐색 체계
- Authors
- KIM, KWANG JAE; CHOI, SEUNGHYUN; LEE,DONGHEE; KIM,EUNSUE; BAE,YOUNGMOK; OH,YOUNGCHAN; PARK,JONGBOM
- Date Issued
- 2021-05-21
- Publisher
- 한국품질경영학회
- Article Type
- Conference
- Citation
- 2021 Spring Conference of Korean Society of Quality Management, 2021-05-21
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.