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Efficient characterization of the beam by nanoparticle diffraction in XFEL

Title
Efficient characterization of the beam by nanoparticle diffraction in XFEL
Authors
HEEMIN, LEEJUNG, CHEOL HONAM, DAEWOONGSONG, CHANGYONG
Date Issued
2017-10-25
Publisher
한국물리학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/108309
Article Type
Conference
Citation
2017년 한국물리학회 가을 학술논문발표회, 2017-10-25
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