Structure investigation of single specimens with femtosecond X-ray laser: Routes to signal-to-noise ratio enhancements
SCIE
SCOPUS
- Title
- Structure investigation of single specimens with femtosecond X-ray laser: Routes to signal-to-noise ratio enhancements
- Authors
- SONG, CHANGYONG; JUNG, CHEOL HO; JUNHA, HWANG; NAM, DAEWOONG; SUNG, DAEHO; DOHYUNG, CHO; HEEMIN, LEE; KIM, SANGSOO; Tono, Kensuke; Yabashi, Makina; Ishikawa, Tetsuya; Noh, Do Young
- Date Issued
- 2020-06
- Publisher
- American Physical Society
- Abstract
- Interest in atomic scale structures of individual specimens has invigorated developments of high-resolution probes, which include single-particle imaging using x-ray free-electron lasers (XFELs). The demonstrated spatial resolution, however, remains at tens of nanometers with difficulty in collecting diffraction signals at high frequency distinguished from noises. As such, various resolution-enhancement methods have been introduced, but few experimental verifications are available. Here, by carrying out XFEL single-pulse diffraction experiments, we explicitly unveil the dependence of SNRs on incident xray flux, data averaging, or multiparticle interference. We further propose a data-accumulation method of resolution-shell averaging as a robust scheme to improve the SNR. This study establishes a roadmap with which high-resolution XFEL single-pulse experiments can be contrived.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/107884
- DOI
- 10.1103/PhysRevApplied.13.064045
- ISSN
- 2331-7019
- Article Type
- Article
- Citation
- Physical Review Applied, vol. 13, no. 6, page. 064045, 2020-06
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.