Investigation of the crystallographic texture and interface roughness on CoCrPt /Ti magnetic thin films

Abstract

The structure and interface of Co74Cr16Pt10 (40 nm thick)/Ti (10 nm thick) films for perpendicular magnetic recording were studied using x-ray scattering and transmission electron microscopy. Improved out-of-plane coercivity and squareness resulted from the combined effects of higher crystallinity and better texture of the CoCrPt (002) film, and increased interface roughness. The relationship of sputtering pressure to the structural effects is discussed. (C) 2003 American Institute of Physics.