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Impact of P/E cycling stress on trap distributions in tunneling and blocking layers for 3-D VNAND flash memory applications
- Title
- Impact of P/E cycling stress on trap distributions in tunneling and blocking layers for 3-D VNAND flash memory applications
- Date Issued
- 2021-02
- Publisher
- ICEIC
- Article Type
- Conference
- Citation
- 2021 International Conference on Electronics, Information, and Communication, 2021-02
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg