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Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms SCIE SCOPUS
- Title
- Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms
- Authors
- Hwu, Y; Hsieh, HH; Lu, MJ; Tsai, WL; Lin, HM; Goh, WC; Lai, B; Je, JH; Kim, CK; Noh, DY; Youn, HS; Tromba, G; Margaritondo, G
- Date Issued
- 1999-10-15
- Publisher
- AMER INST PHYSICS
- Abstract
- Tests performed in different regimes reveal the interplay of two edge-enhancement mechanisms in radiological images taken with coherent synchrotron light. The relative weight of the two mechanisms, related to refraction and to Fresnel edge diffraction, can be changed in a controlled way. This makes it possible to obtain different images of the same object with complementary information. (C) 1999 American Institute of Physics. [S0021-8979(99)03720-2].
- ISSN
- 0021-8979
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED PHYSICS, vol. 86, no. 8, page. 4613 - 4618, 1999-10-15
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg