Evolution of the mound morphology in (111) oriented polycrystalline Pd films and Co Pd multilayered films with Pd underlayers
SCIE
SCOPUS
- Title
- Evolution of the mound morphology in (111) oriented polycrystalline Pd films and Co Pd multilayered films with Pd underlayers
- Authors
- Chung, IB; Koo, YM; Kang, JS; Hong, JH; Jeong, JI
- Date Issued
- 1999-07-01
- Publisher
- AMER INST PHYSICS
- Abstract
- Pd thin films and Co/Pd multilayered films with progressively thicker Pd underlayers are prepared by physical vapor depositions. Their growth behaviors are investigated using atomic force microscopy and transmission electron microscopy. We observed that a mound occurs on top of each crystallite of (111) oriented polycrystalline Pd films and that the average mound size increases according to the capillary-induced coalescence mechanism. We attribute this observed growth instability to the step barrier which resists step-down diffusion of deposited atoms. We also observed that the mound slopes of Co/Pd multilayers are smaller than those of their Pd underlayers. We suggest that this results from a downhill current driven by the interface energy between the Co and Pd layers. (C) 1999 American Institute of Physics. [S0021-8979(99)04712-X].
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10479
- DOI
- 10.1063/1.370729
- ISSN
- 0021-8979
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED PHYSICS, vol. 86, no. 1, page. 306 - 310, 1999-07-01
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