Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering
SCIE
SCOPUS
- Title
- Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering
- Authors
- Yoon, J; Jin, KS; Kim, HC; Kim, G; Heo, K; Jin, S; Kim, J; Kim, KW; Ree, M
- Date Issued
- 2007-06
- Publisher
- BLACKWELL PUBLISHING
- Abstract
- In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for lamellar structures formed in thin films supported on substrates, and a comprehensive numerical analysis was performed using the scattering formula. A quantitative analysis was conducted of lamellar structures formed in nanometre-scaled thin films of a brush polymer, poly[oxy(n-decylthiomethylenyl) ethylene], supported on silicon substrates, by GIXS measurements during cooling and subsequent heating, and data analysis was performed using the scattering formula. This analysis provided details ( long period, sub-layers and their thicknesses, volume fraction, bristle paracrystal distortion factor, and orientation) of the lamellar structure with varying temperature that are not easily obtained using conventional techniques. Moreover, a molecular structure model and electron density profiles were established.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10422
- DOI
- 10.1107/S0021889807009041
- ISSN
- 0021-8898
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. 476 - 488, 2007-06
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