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van der Waals gap-inserted light-emitting p-n heterojunction of ZnO nanorods/graphene/p-GaN film

Title
van der Waals gap-inserted light-emitting p-n heterojunction of ZnO nanorods/graphene/p-GaN film
Authors
Moon, Sung HoJeong, JunseokKim, Gwan WooJin, Dae KwonKim, Yong-JinKim, Jong KyuKim, Keun SooKim, GunnHong, Young Joon
Date Issued
2020-02
Publisher
ELSEVIER SCIENCE BV
Abstract
We report on the electroluminescent (EL) and electrical characteristics of graphene-inserted ZnO nanorods (NRs)/p-GaN heterojunction diode. In a comparative study, ZnO NRs/p-GaN and ZnO NRs/graphene/p-GaN heterojunctions exhibit white and yellow EL emissions, respectively, at reverse bias (rb) voltages. The different EL colors are results of different dichromatic EL peak intensity ratios between 2.25 and 2.8 eV light emissions which are originated from ZnO and p-GaN sides, respectively. The 2.25 eV EL is predominant in both the heterojunctions, because of recombination by numerous electrons tunneled from p-GaN to ZnO across the thin barriers of the staggered broken gap with a large band offset in ZnO/p-GaN and the van der Waals (vdW) gap formed by graphene insertion at ZnO NRs/p-GaN. However, as for the 2.8 eV EL intensity, ZnO NRs/graphene/pGaN hardly shows the EL emission, whereas ZnO NRs/p-GaN exhibits the substantially strong EL peak. We discuss that the significantly reduced 2.8 eV EL emission of ZnO NRs/graphene/p-GaN is a result of decreased depletion layer thickness at p-GaN side where the recombination events occur for 2.8 eV EL before the reverse bias-driven tunneling because the insertion of graphene (or vdW gap barrier) inhibits the carrier diffusion whose amount determines the depletion thickness when forming the heterojunctions. This study opens a way of suppressing (or enhancing) the specific EL wavelength for the dichromatic EL-emitting heterojunctions simply by inserting atom-thick vdW layer.
URI
https://oasis.postech.ac.kr/handle/2014.oak/101205
ISSN
1567-1739
Article Type
Article
Citation
CURRENT APPLIED PHYSICS, vol. 20, no. 2, page. 352 - 357, 2020-02
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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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