Coherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition
SCIE
SCOPUS
- Title
- Coherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition
- Authors
- Seol, SK; Yi, JM; Jin, X; Kim, CC; Je, JH; Tsai, WL; Hsu, PC; Hwu, Y; Chen, CH; Chang, LW; Margaritondo, G
- Date Issued
- 2004-01
- Publisher
- ELECTROCHEMICAL SOC INC
- Abstract
- Localized electrochemical deposition (LECD) is an emerging technology for inexpensive and effective fabrication of high-aspect-ratio microstructure of diverse materials. Microradiology with coherent X-rays enabled study of this process in real-time. This led to the discovery of a fundamental role of the microelectrode-structure distance: for short distances the deposition rate increases dramatically but the product becomes porous. This role is explained qualitatively with the interplay between metal-ion diffusion and migration in the deposition process. (C) 2004 The Electrochemical Society.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/10108
- DOI
- 10.1149/1.1775951
- ISSN
- 1099-0062
- Article Type
- Article
- Citation
- ELECTROCHEMICAL AND SOLID STATE LETTERS, vol. 7, no. 9, page. C95 - C97, 2004-01
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