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End-to-end Latency Measurement in MEC Environment
- Title
- End-to-end Latency Measurement in MEC Environment
- Authors
- HYUN, JONGHWAN; YOO, JAE HYOUNG; HONG, WON KI
- Date Issued
- 2019-05-02
- Publisher
- 한국통신학회
- Article Type
- Conference
- Citation
- JCCI 2019, 2019-05-02
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Related Researcher
- 홍원기HONG, WON KI
- Dept of Computer Science & Enginrg