Atomistic Modeling of the Ti-Al binary system
SCIE
SCOPUS
- Title
- Atomistic Modeling of the Ti-Al binary system
- Authors
- Young-Kwang Kim; Hong-Kyu Kim; Woo-Sang Jung; Lee, BJ
- Date Issued
- 2016-06-15
- Publisher
- ELSEVIER
- Abstract
- An interatomic potential for the Ti-Al binary system has been developed based on the second nearest-neighbor modified embedded-atom method (2NN MEAM) formalism. This potential describes fundamental materials properties (structural, thermodynamic, elastic, defect, deformation and thermal properties) of Ti-Al alloys in good agreements with experimental or first-principles data. The transferability and applicability of the present potential to atomic-scale investigations for Ni-based superalloys or Ti-Al based alloys are demonstrated. (C) 2016 Elsevier B.V. All rights reserved.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/100457
- DOI
- 10.1016/J.COMMATSCI.2016.03.038
- ISSN
- 0927-0256
- Article Type
- Article
- Citation
- Computational Materials Science, vol. 119, page. 1 - 8, 2016-06-15
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- There are no files associated with this item.
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