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Deep Metric Learning Beyond Binary Supervision

Title
Deep Metric Learning Beyond Binary Supervision
Authors
CHO, MINSUKWAK, SU HAKIMSUNGYEONMINKYO, SEOIvan Laptev
Date Issued
2019-06-18
Publisher
IEEE Computer Society
URI
https://oasis.postech.ac.kr/handle/2014.oak/100021
Article Type
Conference
Citation
IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2019-06-18
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조민수CHO, MINSU
Dept of Computer Science & Enginrg
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