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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article

Failure Analysis of Si Nanowire Field-Effect Transistors Subject to Electrostatic Discharge StressesSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 31, no. 9, page. 915 - 917, 2010-09

Article

Investigation of Sub-10-nm Diameter, Gate-All-Around Nanowire Field-Effect Transistors for Electrostatic Discharge ApplicationsSCIESCOPUS

IEEE TRANSACTIONS ON NANOTECHNOLOGY, vol. 9, no. 3, page. 352 - 354, 2010-05

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