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Browsing by  AuthorPARK, JOUNG HUN

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Showing results 10 to 17 of 17
Conference
he 30th Korean Conference on Semiconductors (KCS 2023)

The 30th Korean Conference on Semiconductors (KCS 2023), 2023-02-14

Conference
he 30th Korean Conference on Semiconductors (KCS 2023)

The 30th Korean Conference on Semiconductors (KCS 2023), 2023-02-14

Conference
Impact of P/E cycling stress on trap distributions in tunneling and blocking layers for 3-D VNAND flash memory applications

2021 International Conference on Electronics, Information, and Communication, 2021-02

Article
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash MemorySCIESCOPUS

IEEE Access, vol. 10, page. 62423 - 62428, 2022-06

Conference
Investigation of Trap Profiles of Tunneling and Blocking Layers after P/E Cycling Stress in 3-D VNAND Flash Memory

제28회 한국반도체학술대회, 2021-01

Conference
Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory

제28회 한국반도체학술대회, 2021-01

Conference
Trap analysis from Hysteresis Characteristics of 3D-NAND Flash Memory

제28회 한국반도체학술대회, 2021-01

Conference
Variation of Electrical and Memory Characteristics of Non-Circular Cell in 3D-NAND Flash Memory

제29회 한국반도체학술대회, 2022-01-26

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