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JANG, HYUN MYUNG(장현명)
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Div of Advanced Materials Science(첨단재료과학부)
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Publication & Time Cited Count (For the Last 5 years)
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2010
1
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Article
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MEMORIES
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SCIE
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SCOPUS
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: 2010
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Article
Kelvin probe force microscopy for conducting nanobits of NiO thin films
SCIE
SCOPUS
NANOTECHNOLOGY, vol. 21, no. 21, page. 215704-1 - 215704-5, 2010-05-28
Son, JY
;
Shin, YH
;
Kim, H
;
Cho, JH
;
Jang, H
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