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JE, JUNG HO(제정호)
scopus
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Dept of Materials Science & Engineering(신소재공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2001
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Article
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CONTRAST
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IMAGES
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MEPHISTO
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photoelectron emission
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RESOLUTION
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SPECTROMICROSCOPY
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SURFACES
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SYNCHROTRON-RADIATION
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THIN-FILMS
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X-ray absorption spectroscopy
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Article
Using photoelectron emission microscopy with hard-X-rays
SCIE
SCOPUS
SURFACE SCIENCE, vol. 480, no. 3, page. 188 - 195, 2001-06-01
Hwu, Y
;
Tsai, WL
;
Lai, B
;
Je, JH
;
Fecher, GH
;
et al
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