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Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2017
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Article
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DEVICES
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SCIE
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SCOPUS
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Date Issued
: 2017
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Article
In situ TEM observation on the interface-type resistive switching by electrochemical redox reactions at a TiN/PCMO interface
SCIE
SCOPUS
Nanoscale, vol. 9, no. 2, page. 582 - 593, 2017-01
HWANG, HYUNSANG
;
Kyungjoon Baek
;
Sangsu Park,
;
Jucheol Park
;
Young-Min Kim
;
et al
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