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HWANG, HYUNSANG(황현상)
scopus
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Dept of Materials Science & Engineering(신소재공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2015
1
Type
Article
1
Subject
accelerated test
1
memories
1
memory fault diagnosis
1
memory testing
1
ReRAM
1
retention
1
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SCIE
1
SCOPUS
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: scie
Subject
: ReRAM
Subject
: accelerated test
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Article
Accelerated Retention Test Method by Controlling Ion Migration Barrier of Resistive Random Access Memory
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 3, page. 238 - 240, 2015-03
Koo, Y
;
Ambrogio, S
;
Woo, J
;
Song, J
;
Ielmini, D
;
et al
1
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