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KIM, HYUNGJUN(김형준)
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Dept of Materials Science & Engineering(신소재공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2007
1
Type
Article
1
Subject
DIELECTRICS
1
HFO2
1
high-resolution transmission elec...
1
interfacial layer
1
MOLECULAR-BEAM EPITAXY
1
SI
1
SURFACE
1
tantalum oxide
1
TECHNOLOGY
1
THIN-FILMS
1
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SCIE
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SCOPUS
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Subject
: THIN-FILMS
Date Issued
: 2007
Subject
: high-resolution transmission electron microscopy
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Article
Dependence of electrical properties on interfacial layer of Ta2O5 films
SCIE
SCOPUS
MICROELECTRONIC ENGINEERING, vol. 84, no. 12, page. 2865 - 2868, 2007-12
Lee, JW
;
Ham, MH
;
Maeng, WJ
;
Kim, H
;
Myoung, JM
1
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