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HAN, HAEWOOK(한해욱)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2009
1
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Article
1
Subject
Atomic force microscopy
1
MODE
1
MODULATION
1
Near-field scanning optical micro...
1
RESOLUTION
1
SURFACE
1
Tuning fork
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KCI
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SCIE
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Journal Registered
: kci
Subject
: Atomic force microscopy
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Article
Direct Differential Optical Detection of the Oscillation Amplitude of Tuning Forks for Atomic Force Microscopy
SCIE
SCOPUS
KCI
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 54, no. 4, page. 1738 - 1741, 2009-04
Kim, J
;
Han, Y
;
Moon, K
;
Jung, E
;
Han, H
1
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