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YOU, HEECHEON(유희천)
scopus
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Dept. of Industrial & Management Eng.(산업경영공학과)
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Publication & Time Cited Count (For the Last 5 years)
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2017
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Article
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3D scanning
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3D-scanning
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Anthropometry
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Automation
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Direct measurement
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direct measurement
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ERROR
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Hand anthropometry
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hand anthropometry
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Measurement protocol
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Subject
: Anthropometry
Date Issued
: 2017
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: scie
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: hand anthropometry
Date Issued
: 2017
Subject
: Measurement protocol
Date Issued
: 2017
Subject
: hand anthropometry
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Article
Comparison of a semiautomatic protocol using plastering and three-dimensional scanning techniques with the direct measurement protocol for hand anthropometry
SCIE
SSCI
SCOPUS
Human Factors and Ergonomics In Manufacturing, vol. 27, no. 3, page. 138 - 146, 2017-05
Lee, W.
;
Yang, X.
;
Yoon, S.
;
Lee, B.
;
Jeon, E.
;
et al
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