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LEE, JEONG SOO(이정수)
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scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2022
1
Type
Article
1
Subject
3D NAND flash memory
1
bandgap-engineered tunneling
1
DEFECTS
1
ELECTRON TRAP
1
erase cycling
1
OXYNITRIDE
1
program
1
TEMPERATURE
1
trap profile
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TSCIS
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SCIE
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SCOPUS
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Date Issued
: [2020 TO 2023]
Subject
: bandgap-engineered tunneling
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Article
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory
SCIE
SCOPUS
IEEE Access, vol. 10, page. 62423 - 62428, 2022-06
GILSANG, YOONGILSANG
;
GO, DONGHYUN
;
PARK, JOUNG HUN
;
KIM, DONGHWI
;
Kim, Jungsik
;
et al
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