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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2012
1
Type
Article
1
Subject
DIFFUSION
1
Dynamic random access memory (DRAM)
1
IMPACT
1
LEAKAGE CURRENT
1
Mechanical stress
1
MOSFETS
1
Recess channel array transistor (...
1
Refresh time
1
Shallow trench isolation (STI)
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STI
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SCIE
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SCOPUS
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Subject
: MOSFETS
Subject
: DIFFUSION
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Article
Measurement of mechanical stresses induced by hybrid shallow-trench-isolation for dynamic random access memory using recess channel array transistor structure
SCIE
SCOPUS
Microelectronic Engineering, vol. 91, page. 44 - 49, 2012-03
Lee, S
;
Kim, D
;
Kim, C
;
Oh, TK
;
Cha, SY
;
et al
1
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