Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
IEEE ELECTRON DEVICE LETTERS, vol. 33, no. 2, page. 137 - 139, 2012-02
Japanese Journal of Applied Physics, vol. 51, no. 2, 2012-02
MICROELECTRONIC ENGINEERING, vol. 85, no. 8, page. 1820 - 1825, 2008-08