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KANG, BONG KOO(강봉구)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2016
1
Type
Article
1
Subject
AC stress
1
ELECTRON
1
HOT-CARRIER DEGRADATION
1
MODEL
1
MOSFETS
1
N-MOS-TRANSISTORS
1
Neutral trap
1
nMOSFETs
1
VOLTAGE
1
Width dependence
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SCIE
1
SCOPUS
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Subject
: MOSFETS
Subject
: AC stress
Subject
: N-MOS-TRANSISTORS
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Article
Channel width dependence of AC stress on bulk nMOSFETs
SCIE
SCOPUS
Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
Donghee Son
;
Gang-Jun Kim
;
Ji-Hoon Seo
;
Lee, NH
;
Kang, Y
;
et al
1
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