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Cited 40 time in webofscience Cited 45 time in scopus
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dc.contributor.authorMoon, K-
dc.contributor.authorDo, Y-
dc.contributor.authorLim, M-
dc.contributor.authorLee, G-
dc.contributor.authorKang, H-
dc.contributor.authorPark, KS-
dc.contributor.authorHan, H-
dc.date.accessioned2015-06-25T01:28:21Z-
dc.date.available2015-06-25T01:28:21Z-
dc.date.created2013-03-07-
dc.date.issued2012-07-02-
dc.identifier.issn0003-6951-
dc.identifier.other2015-OAK-0000026909en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9750-
dc.description.abstractWe present quantitative coherent measurements of scattering pulses and spectra in terahertz apertureless near-field microscopes. Broadband near-field image contrasts for both amplitude and phase spectra are measured directly from time-domain scattering signals with an unprecedentedly high single-scan signal-to-noise ratio (similar to 48 dB), with approach curves for both short (< 200 nm) and long (up to 82 mu m) ranges. By using the line dipole image method, we obtain quantitative broadband THz imaging contrasts with nanoscale resolution. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733475]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleQuantitative coherent scattering spectra in apertureless terahertz pulse near-field microscopes-
dc.typeArticle-
dc.contributor.college전자전기공학과en_US
dc.identifier.doi10.1063/1.4733475-
dc.author.googleMoon, Ken_US
dc.author.googleDo, Yen_US
dc.author.googleHan, Hen_US
dc.author.googlePark, KSen_US
dc.author.googleKang, Hen_US
dc.author.googleLee, Gen_US
dc.author.googleLim, Men_US
dc.relation.volume101en_US
dc.relation.issue1en_US
dc.contributor.id10056174en_US
dc.relation.journalAPPLIED PHYSICS LETTERSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.101, no.1-
dc.identifier.wosid000306144800010-
dc.date.tcdate2019-01-01-
dc.citation.number1-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume101-
dc.contributor.affiliatedAuthorHan, H-
dc.identifier.scopusid2-s2.0-84863644731-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc21-
dc.description.scptc25*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle-
dc.subject.keywordPlusOPTICAL MICROSCOPY-
dc.subject.keywordPlusCONTRAST-
dc.subject.keywordPlusRADIATION-
dc.subject.keywordPlusARTIFACTS-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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한해욱HAN, HAEWOOK
Dept of Electrical Enginrg
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