DC Field | Value | Language |
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dc.contributor.author | Kim, Jiwon | - |
dc.contributor.author | Oh, Hyeongwan | - |
dc.contributor.author | Jin, Bo | - |
dc.contributor.author | Baek, Rock-Hyun | - |
dc.contributor.author | Lee, Jeong-Soo | - |
dc.date.accessioned | 2019-02-25T04:12:11Z | - |
dc.date.available | 2019-02-25T04:12:11Z | - |
dc.date.created | 2018-05-15 | - |
dc.date.issued | 2018-09 | - |
dc.identifier.issn | 1533-4880 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/94677 | - |
dc.description.abstract | The analog figure-of-merits (FOMs) of conventional inversion-mode (IM) and junctionless (JL) NanoWire Field Effect Transistor (NWFET) have been investigated, considering the gate WorkFunction Variability (WFV) and Random Discrete Dopant (RDD) using 3-dimensional (3D) TCAD simulation. While the JL-NWFET shows higher immune to WFV on analog FOMs, it can be easily affected by RDD due to higher channel doping level. On the other hand, the IM-NWFET shows stronger correlation between transconductance (g(m)) and gate capacitance (C-gg), leading to similar variation in cut-off frequency (f(t)) even though it shows larger g(m) and C-gg variation compared to JL-NWFET. | - |
dc.language | English | - |
dc.publisher | AMER SCIENTIFIC PUBLISHERS | - |
dc.relation.isPartOf | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.title | Analog Figure-of-Merits Comparison of Gate Workfunction Variability and Random Discrete Dopant Between Inversion-Mode and Junctionless Nanowire FETs | - |
dc.type | Article | - |
dc.identifier.doi | 10.1166/jnn.2018.15704 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.18, no.9, pp.6598 - 6601 | - |
dc.identifier.wosid | 000430706900136 | - |
dc.citation.endPage | 6601 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 6598 | - |
dc.citation.title | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.citation.volume | 18 | - |
dc.contributor.affiliatedAuthor | Kim, Jiwon | - |
dc.contributor.affiliatedAuthor | Oh, Hyeongwan | - |
dc.contributor.affiliatedAuthor | Baek, Rock-Hyun | - |
dc.contributor.affiliatedAuthor | Lee, Jeong-Soo | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TRANSISTORS | - |
dc.subject.keywordAuthor | Analog Figure-of-Merit | - |
dc.subject.keywordAuthor | Workfunction Variability (WFV) | - |
dc.subject.keywordAuthor | Random Discrete Dopant (RDD) | - |
dc.subject.keywordAuthor | Junctionless | - |
dc.subject.keywordAuthor | Nanowire | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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