Full metadata record
DC Field | Value | Language |
dc.contributor.author | 제정호 | - |
dc.date.accessioned | 2018-06-23T14:10:24Z | - |
dc.date.available | 2018-06-23T14:10:24Z | - |
dc.date.created | 2009-03-27 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/90648 | - |
dc.publisher | Institute of Physics, Poland Academy of Science | - |
dc.relation.isPartOf | (Invited Talk) in Seminar | - |
dc.relation.isPartOf | (Invited Talk) in Seminar | - |
dc.title | Combined use of diffraction microscopy, topography, and radiology using synchrotron x-rays | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | (Invited Talk) in Seminar | - |
dc.citation.conferenceDate | 2005-10-21 | - |
dc.citation.title | (Invited Talk) in Seminar | - |
dc.contributor.affiliatedAuthor | 제정호 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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